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Workshop on High Power Electromagnetic (HPEM) Threats – High Altitude Electromagnetic Pulse (HEMP) and Intentional Electromagnetic Interference (IEMI)
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This is the second workshop covering new developments in two important high power electromagnetic (HPEM) threats – High-altitude electromagnetic pulse (HEMP) and Intentional Electromagnetic Interference (IEMI). In 1989 the International Electrotechnical Commission (IEC),in particular its technical committee 77 and its subcommittee SC77C headquartered in Geneva, began to develop HEMP standards, and as of August 2009, twenty publications covering the threats of HEMP and IEMI, their impacts on commercial electronic equipment and systems, and protective methods have been published. In 2004 and 2008 the US Congressional EMP Commission published two important documents dealing with the threat of HEMP on the United States with emphasis on the critical infrastructures. These two publications have clearly indicated the level of threat of such high power electromagnetic fields to society in general and to specific infrastructures such as power and communications.
In addition to the work performed by the IEC and the EMP Commission, three other organizations have become active in writing standards to protect equipment and systems against these threats. First the IEEE EMC Society is working on a recommended practice for protecting public accessible computers from IEMI. The ITU-T has recently completed work on two recommendations to protect telecommunications centers from HEMP and IEMI. Finally Cigré (International Council on Large Electric Systems) has recently begun work to write a report on how to protect high-voltage substation electronics from the threat of IEMI.
This workshop will review the standardization work of the IEC, the IEEE, the ITU-T and Cigré. In addition, the major features and conclusions of the EMP Commission will be reviewed |
In the HPEM Threats workshop, you will learn:
- Overview of the IEC HEMP Publications
- The effects caused by HEMP
- The radiated and conducted HEMP environment
- The classification of the HEMP environments
- HEMP test approaches
- HEMP test facilities worldwide
- HEMP protection approaches
- HEMP immunity test standard
- HEMP generic standard
- Overview of the IEC IEMI Publications
- The effects caused by IEMI
- The radiated IEMI environment
- The conducted IEMI environment
- Measurement methods for IEMI
- HPEM/IEMI test facilities worldwide
- Review EMP Commission Reports
- Review of HEMP and IEMI standardization work in other organizations
Who Should Attend
Those responsible for protecting systems from HPEM:
- Product Managers and Developers
- Critical Facility Developers
- EMC Engineers and test technicians
- Test Instrumentation Developers
- Test instrumentation and chamber manufacturers
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Hotel
Arrangements are responsibility of attendee. UL CCS recommends the Hyatt Place Fremont/Silicon Valley, 3101 West Warren Avenue, Fremont, CA 94538. Tel:510-623-6000 (www.hyattplacefremont.com).
Expert Instructor
Workshop features as lead instructor,
Dr. William Radasky, IEEE Fellow, EMP Fellow, Chairman of IEC SC 77C, and President of Metatech Corporation.
Workshop Location
UL CCS Headquarters USA
47173 Benicia Street
Fremont, CA 94538
510-771-1000
Fee Includes:
Lecture notebook, lunch, breaks, and completion certificate.
Agenda
March 25: 8:30 am Registration
Class: 9:00 am to 5:00 pm
March 26: Class: 9:00 am to 5:00 pm
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